000 00943nac a22002531u 4500
010 _a 96026600
020 _a0890066523 (alk. paper)
082 0 0 _a621.3693
_bUED
090 _c7489
_d7489
100 _aUeda, Osamu.
245 1 0 _aReliability and degradation of III-V optical devices /
_cOsamu Ueda.
246 3 _aReliability and degradation of 3-5 optical devices
246 3 _aReliability and degradation of three-five optical devices
260 _aBoston :
_bArtech House,1996
_cc1996.
300 _axii, 353 p. :
_bill. ;
_c24 cm.
500 _adistributer: Al-Ahram
504 _aIncludes bibliographical references and index.
511 _acatalogued by: wessam
650 0 _aGallium arsenide semiconductors
_xReliability.
650 0 _aSemiconductors
_xFailures.
650 0 _aLight emitting diodes
_xReliability.
650 0 _aCrystals
_xDefects.
942 _cBB
_k621.3693UED
952 _p000008919
_u9175
_dMAIN
_v2024-01-08
_y0
_bMAIN
999 _c7489
_d7489