000 | 00943nac a22002531u 4500 | ||
---|---|---|---|
010 | _a 96026600 | ||
020 | _a0890066523 (alk. paper) | ||
082 | 0 | 0 |
_a621.3693 _bUED |
090 |
_c7489 _d7489 |
||
100 | _aUeda, Osamu. | ||
245 | 1 | 0 |
_aReliability and degradation of III-V optical devices / _cOsamu Ueda. |
246 | 3 | _aReliability and degradation of 3-5 optical devices | |
246 | 3 | _aReliability and degradation of three-five optical devices | |
260 |
_aBoston : _bArtech House,1996 _cc1996. |
||
300 |
_axii, 353 p. : _bill. ; _c24 cm. |
||
500 | _adistributer: Al-Ahram | ||
504 | _aIncludes bibliographical references and index. | ||
511 | _acatalogued by: wessam | ||
650 | 0 |
_aGallium arsenide semiconductors _xReliability. |
|
650 | 0 |
_aSemiconductors _xFailures. |
|
650 | 0 |
_aLight emitting diodes _xReliability. |
|
650 | 0 |
_aCrystals _xDefects. |
|
942 |
_cBB _k621.3693UED |
||
952 |
_p000008919 _u9175 _dMAIN _v2024-01-08 _y0 _bMAIN |
||
999 |
_c7489 _d7489 |