000			00820nac a22002291u 4500
010			_a 88020730
020			_a0471917028 :
022			_a0471935735
082	0	0	_a621.38152 _bLOO
090			_c5466 _d5466
100			_aLook, D. C.
245	1	0	_aElectrical characterization of GaAs materials and devices / _cDavid C. Look.
260			_aChichester ; _aNew York : _bWiley,c1989. _cc1989.
300			_ax, 280 p. : _bill. ; _c24 cm.
440		0	_aDesign and measurement in electronic engineering
500			_aDistributer : Al Ahram.
504			_aIncludes bibliographical references (p. 261-275) and index.
511			_aCatalogued By : Mahitab.
650		0	_aGallium arsenide semiconductors _xTesting.
650		0	_aMagnetoresistance.
942			_cBB _k621.38152LOO
952			_p000006721 _u6994 _dMAIN _v2019-10-07 _y0 _bMAIN
999			_c5466 _d5466