| 000 | 00983cam a22003015a 4500 | ||
|---|---|---|---|
| 001 | 015777367 | ||
| 003 | OSt | ||
| 005 | 20150604122410.0 | ||
| 008 | 110318t2015 si a frb 001 0 eng d | ||
| 020 | _a9789814303590 (hbk.) | ||
| 020 | _a9814303593 (hbk.) | ||
| 040 |
_aStDuBDS _beng _cStDuBDS _dEG-ScBUE |
||
| 082 | 0 | 4 |
_a620.11272 _222 _bXRA |
| 245 | 0 | 0 |
_aX-ray diffraction : _bmodern experimental techniques / _cedited by Oliver H. Seeck, Bridget Murphy. |
| 260 |
_aSingapore : _bPan Stanford ; _cc.2015. |
||
| 300 |
_axv, 427 p. : _bill. ; _c24 cm. |
||
| 500 | _aIndex : p. 421-427. | ||
| 504 | _aIncludes bibliographical references. | ||
| 650 | 0 |
_aRadiography, Industrial. _2BUEsh |
|
| 650 | 0 |
_aX-rays _xDiffraction. _2BUEsh |
|
| 650 | 0 |
_aNanostructured materials _xAnalysis. _2BUEsh |
|
| 651 | _2BUEsh | ||
| 653 |
_bENGGEN _cJune2015 |
||
| 655 |
_vreading book _934232 |
||
| 700 | 1 |
_aMurphy, Bridget, _eeditor. |
|
| 700 | 1 |
_aSeeck, Oliver H. _938119 _eeditor. |
|
| 942 | _2ddc | ||
| 999 |
_c19490 _d19462 |
||