000 01516cam a2200337 a 4500
001 15215163
005 20081014162343.0
008 080311s2008 nyua | b 001 0 eng d
010 _a 2008011458
020 _a9780071502443 (alk. paper)
020 _a0071502440 (alk. paper)
035 _a(OCoLC)ocn213385024
035 _a(OCoLC)213385024
040 _aDLC
_cDLC
_dBAKER
_dC#P
_dDLC
050 0 0 _aQA76.76.Q35
_bJ66 2008
082 0 0 _a005.14
_222
_bJON
100 1 _aJones, Capers.
_912304
245 1 0 _aApplied Software Measurement :
_bGlobal Analysis of Productivity and Quality /
_cCapers Jones.
250 _a3rd ed.
260 _aNew York :
_bMcGraw-Hill,
_cc2008.
300 _axxxii, 662 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index.
650 0 _aSoftware measurement.
_912305
650 0 _aFunction point analysis.
_912306
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/enhancements/fy0826/2008011458-b.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0826/2008011458-d.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/enhancements/fy0829/2008011458-t.html
942 _2ddc
_cBB
999 _c13594
_d13594
952 _p000019136
_40
_epurchase
_00
_u20582
_bMAIN
_10
_o005.14 JON
_d2010-03-07
_8Alahram
_h34
_70
_cLIB1
_2ddc
_g472.50
_yBB
_aMAIN