000 01010cam a2200265 i 4500
001 408643
005 19840614000000.0
008 800110s1980 nyua b 101 0 eng
010 _a 80000388
020 _a0306404230
040 _aDLC
_cDLC
_dDLC
050 0 0 _aTN689.2
_b.M443
082 0 0 _a669.95
_219
_bMET
245 0 0 _aMetallography as a quality control tool /
_cedited by James L. McCall and P. M. French.
260 _aNew York :
_bPlenum Press,
_cc1980.
300 _avii, 337 p. :
_bill. ;
_c26 cm.
500 _aProceedings of the symposium held July 8-9, 1979.
504 _aIncludes bibliographical references and indexes.
650 0 _aMetallography
_xCongresses.
_96767
650 0 _aQuality control
_xCongresses.
_96768
700 1 _aMcCall, James L.
_96769
700 1 _aFrench, P. M.
_q(Peter Michael),
_d1935-
_96770
942 _2ddc
_cBB
999 _c11987
_d11987
952 _p000016699
_40
_epurchase
_00
_u17499
_bMAIN
_10
_o669.95 MET
_d2009-06-23
_8Alef-Baa
_h150
_70
_cLIB1
_2ddc
_g880
_yBB
_aMAIN