| 000 | 01049nam a22002775a 4500 | ||
|---|---|---|---|
| 001 | 15187446 | ||
| 005 | 20080220180003.0 | ||
| 008 | 080220s2008 nyu 000 0 eng | ||
| 010 | _a 2008923469 | ||
| 020 | _a9780387787008 (hardcover : alk. paper) | ||
| 040 |
_aDLC _cDLC |
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| 082 |
_222 _a621.381 _bMIC |
||
| 245 | 0 | 0 |
_aMicro and nano mechanical testing of materials and devices / _c[edited by] Fuqian Yang, James C.M. Li. |
| 260 |
_aNew York : _bSpringer, _c2008. |
||
| 263 | _a0806 | ||
| 300 |
_axiii, 387 p. : _bill. ; _c 24 cm. |
||
| 500 | _aIncludes index | ||
| 650 |
_93987 _a Materials _x-- Testing. |
||
| 650 |
_93988 _aMicroelectromechanical systems _x-- Testing. |
||
| 650 |
_93989 _aNanoelectromechanical systems _x-- Testing. |
||
| 700 |
_93990 _aYang, Fuqian |
||
| 700 |
_93991 _aLi, James C. M. |
||
| 942 |
_2ddc _cBB |
||
| 952 |
_w2009-04-21 _p000016046 _r2009-04-21 _40 _epurchase _00 _u16523 _bMAIN _10 _o621.381 MIC _d2009-04-21 _8Alahram _h362 _70 _cLIB1 _2ddc _g696.00 _yBB _aMAIN |
||
| 999 |
_c11367 _d11367 |
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