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		Surface analysis of polymers by XPS and static SIMS / D. Briggs. by Briggs, D Series: Cambridge solid state science series Material type: Text Publication details: Cambridge, U.K. ; New York : Cambridge University Press,c.1998. c.1998 Online access: Publisher description Table of contents Availability: Items available for loan: Central Library (1)Call number: 620.192BRI. Log in to add tags Add to cart (remove)
		Electron microprobe analysis / S. J. B. Reed. by Reed, S. J. B Series: Cambridge monographs on physics Material type: Text; Literary form: Not fiction ; Audience: Specialized; Publication details: Cambridge : Cambridge University Press, 1975 Availability: Items available for loan: Central Library (1)Call number: 543.081 REE. Log in to add tags Add to cart (remove)
		High-Resolution X-Ray Spectroscopy : Past, Present and Future / [edited by] Jelle Kaastra, Frits Paerels. by Kaastra, Jelle Sjerp, 1957- Paerels, Frits Edition: 1st ed. Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : Springer, 2011 Availability: Items available for loan: Central Library (1)Call number: 522.67 HIG. Log in to add tags Add to cart (remove)
		Electron microprobe analysis / S. J. B. Reed. by Reed, S. J. B Edition: 2nd ed. Material type: Text; Literary form: Not fiction ; Audience: Specialized; Publication details: Cambridge : Cambridge University Press, 1997 Availability: Items available for loan: Central Library (1)Call number: 543.081 REE. Log in to add tags Add to cart (remove)

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