TY  - GEN
AU  - Briggs, D.                   
TI  - Surface analysis of polymers by XPS and static SIMS
SN  - 0521352223 (hardback)
U1  - 620.192 
PY  - 1998///
CY  - Cambridge, U.K., New York
PB  - Cambridge University Press,c.1998.
KW  - Polymers
KW  - Surfaces
KW  - Analysis
KW  - X-ray spectroscopy
KW  - Secondary ion mass spectrometry
N1  - Distributer:Al-Ahram; Includes bibliographical references (p. 190-193) and index; Catalogued by: Mahitab
UR  - http://www.loc.gov/catdir/description/cam028/97026059.html
UR  - http://www.loc.gov/catdir/toc/cam022/97026059.html
ER  -