TY  - GEN
AU  - Ueda, Osamu.                 
TI  - Reliability and degradation of III-V optical devices
SN  - 0890066523 (alk. paper)
U1  - 621.3693 
PY  - 1996///
CY  - Boston
PB  - Artech House,1996
KW  - Gallium arsenide semiconductors
KW  - Reliability
KW  - Semiconductors
KW  - Failures
KW  - Light emitting diodes
KW  - Crystals
KW  - Defects
N1  - distributer: Al-Ahram; Includes bibliographical references and index; catalogued by: wessam
ER  -