TY  - BOOK
AU  - Yang, Fuqian
AU  - Li, James C. M.
TI  - Micro and nano mechanical testing of materials and devices
SN  - 9780387787008 (hardcover : alk. paper)
U1  - 621.381 22
PY  - 2008///
CY  - New York
PB  - Springer
KW  -  Materials
KW  - -- Testing
KW  - Microelectromechanical systems
KW  - --  Testing
KW  - Nanoelectromechanical systems
N1  - Includes index
ER  -