Fault-tolerance and reliability techniques for high-density random-access memories / Kanad Chakraborty, Pinaki Mazumder.
Material type: TextPublication details: New Delhi : Prentice Hall of India, c2002.Description: xix, 426 p. : ill. ; 25 cmISBN:- 0130084654
- 621.39/73 C4356
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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Book - Borrowing | Central Library First floor | 621.3973 CHA (Browse shelf(Opens below)) | Available | 000003870 |
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621.395 YAR Digital logic : | 621.3950284 ERA Crystal growth and evaluation of silicon for VLSI and ULSI / | 621.3950285 ATT PSPICE and MATLAB for Electronics : | 621.3973 CHA Fault-tolerance and reliability techniques for high-density random-access memories / | 621.39732 BAK CMOS : | 621.39732 BAK CMOS : | 621.39732 INT Intelligent integrated systems : technologies, devices and architectures / |
Includes bibliographical references (p. 377-417) and index.
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