Crystal growth and evaluation of silicon for VLSI and ULSI / Golla Eranna.
Material type: TextPublication details: Boca Raton, FL: CRC Press, Taylor & Francis, c.2015Description: xvii,411 p.: ill. ; 24 cmISBN:- 9781482232813 (hardback : alk. paper)
- 1482232812 (hardback : alk. paper)
- 621.3950284 22 ERA
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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Book - Borrowing | Central Library First floor | Baccah | 621.3950284 ERA (Browse shelf(Opens below)) | Available | 000037554 |
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621.395 WES Integrated Circuit Design / | 621.395 WES CMOS VLSI design : | 621.395 YAR Digital logic : | 621.3950284 ERA Crystal growth and evaluation of silicon for VLSI and ULSI / | 621.3950285 ATT PSPICE and MATLAB for Electronics : | 621.3973 CHA Fault-tolerance and reliability techniques for high-density random-access memories / | 621.39732 BAK CMOS : |
Includes bibliographical references and index.
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