Thin film materials : stress, defect formation, and surface evolution / L.B. Freund, S. Suresh.
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 0521822815
- 9780521529778
- 621.38152 21 FRE
- TA418.9.T45 F74 2003
Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
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Central Library First floor | Alahram | 621.38152 FRE (Browse shelf(Opens below)) | 35 | Available | 000019599 |
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621.38152 DIM Principles of semiconductor devices / | 621.38152 DIM Understanding Semiconductor Devices / | 621.38152 FOC Focused ion beam systems : | 621.38152 FRE Thin film materials : | 621.38152 HAN Handbook of thin film deposition : | 621.38152 LOW Semiconductor x-ray detectors / | 621.38152 NEA An introduction to Semiconductor devices / |
Includes Index.
Includes bibliographical references (p. 713-737) and indexes.
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